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RF Chip testing
Our customer designs radio frequency chips such as power amplifiers, switches and low-noise amplifiers (LNA). The configuration port used by this company used to be easily controllable with a microcontroller and a GPIO. With time our customer had progressively replaced the chip's interface with custom serial interfaces using a protocol close to SPI. To spare pins, some of these interfaces used a 3 wires serial interface (clock, data and chip select). Customer's requirements - the customer needed a device to allow their engineers to manually test of the chips after manufacturing; Byte Paradigm's solution Byte Paradigm proposed 2 solutions based on SPI Xpress device and GP series devices (GP-22050 first, then GP-24100 ). SPI Xpress was already able to interface any standard SPI interface on 4 wires (SCLK, SS, MISO, MOSI) and could be controlled by means of C/C++ programs. Byte Paradigm extended the functionalities of SPI Xpress to allow it to interface 3-wires SPI interfaces, where the MOSI and MISO lines are merged as a single bidirectional data line. Byte Paradigm also offered guidelines to this customer to help him call the C/C++ DLL functions from Visual Basic. The 3-wires interface is new available in standard with SPI Xpress Finally, when the customer required other custom interfaces, Byte Paradigm proposed the GP Series devices, which offer the same capabilities as the SPI Xpress and are also able to function as a general purpose Digital Pattern Generator. As a digital pattern generator, a GP device is able to stimulate any digital interface up to 16 bit wide, with arbitrary logic patterns. This mode of operation of GP series device offered the flexibility required by the customer, with GP-22050 first (max. pattern frequency: 50 MHz), and now with GP-24100 (max. pattern frequency 100 MHz). Recommended products - SPI Xpress for 3-wires and 4-wires serial interfaces up to 50 MHz |
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